首页> 外国专利> RETICLE ASSEMBLY, A LITHOGRAPHY APPARATUS, AND A METHOD FOR PROJECTING TWO OR MORE IMAGE FIELDS WITH A SINGLE SCANNING OPERATION OF A LITHOGRAPHY PROCESS CAPABLE OF IMPROVING THE EFFICIENCY OF SCANNING OPERATIONS IN THE LITHOGRAPHY APPARATUS

RETICLE ASSEMBLY, A LITHOGRAPHY APPARATUS, AND A METHOD FOR PROJECTING TWO OR MORE IMAGE FIELDS WITH A SINGLE SCANNING OPERATION OF A LITHOGRAPHY PROCESS CAPABLE OF IMPROVING THE EFFICIENCY OF SCANNING OPERATIONS IN THE LITHOGRAPHY APPARATUS

机译:掩模版,光刻技术以及用于投射两个或多个图像场的方法,该扫描技术可以对光刻过程进行一次扫描操作,从而可以提高光刻设备的扫描操作效率

摘要

PURPOSE: A reticle assembly, a lithography apparatus, and a method for projecting two or more image fields with a single scanning operation of a lithography process are provided to project two or more image fields on a first target unit and a second target unit.;CONSTITUTION: A lighting system conditions a radiation beam(B). A mask table(MT) supports a patterning device(MA). A first position setting device(PM) accurately positions the patterning device according to preset parameters. A second position setting device(PW) accurately positions a substrate according to the preset parameters. A projection system(PS) projects a pattern given to the radiation beam on a target unit of the substrate.;COPYRIGHT KIPO 2013
机译:目的:提供一种标线片组件,一种光刻设备以及一种用于利用光刻工艺的单次扫描操作来投影两个或更多个图像场的方法,以将两个或更多个图像场投影在第一目标单元和第二目标单元上。组成:照明系统调节辐射束(B)。掩模台(MT)支持图案形成装置(MA)。第一位置设置装置(PM)根据预设参数精确地定位图案形成装置。第二位置设置装置(PW)根据预设参数精确地定位基板。投影系统(PS)将赋予辐射束的图案投影到基板的目标单元上。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130056830A

    专利类型

  • 公开/公告日2013-05-30

    原文格式PDF

  • 申请/专利权人 ASML NETHERLANDS B.V.;

    申请/专利号KR20120132354

  • 发明设计人 VAN DER VEEN PAUL;

    申请日2012-11-21

  • 分类号H01L21/027;G03F7/20;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:04

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