INFRARED SENSOR CHIP, AN INFRARED SENSOR, AND AN OPERATING METHOD AND TESTING METHOD THEREOF, CAPABLE OF MINIMIZING COSTS FOR PROCESSING A FAULTY PRODUCT

摘要

PURPOSE: An infrared sensor chip, an infrared sensor, and an operating method and testing method thereof are provided to reduce costs for manufacturing the infrared sensor and developing the same and to improve a yield for monitoring a process.;CONSTITUTION: An infrared sensor chip comprises a CMOS(Complementary Metal-Oxide Semiconductor) circuit board(110) and a bolometer(120). The CMOS circuit board is composed of an active matrix(111), a low line selecting unit, and an output multiplexer unit. The bolometer is laminated on the CMOS circuit board and composed of an active cell and a reference cell. The low line selecting unit selects a cell among the cells of the bolometer for a parametric test with respect to the bolometer of a wafer or a chip state. A voltage is applied to the selected cell. The output multiplexer unit output current properties according to the application of the voltage.;COPYRIGHT KIPO 2013;[Reference numerals] (111,BB) Active matrix + SA + ADC; (120,AA) Infrared sensor; (200) Sa-FPA controller(SA/ADC/SP controller); (CC) ISP/Controller; (DD) Infrared sensor in prior art; (EE) Infrared sensor in the present invention