INFRARED SENSOR CHIP, INFRARED DETECTOR AND METHOD FOR OPERATING AND TESTING THE SAME

摘要

embodiment according to the active matrix, row line selection unit and the output portion multiplexer is configured a CMOS circuit substrate; And of the CMOS circuit it is laminated on a substrate, including a bolometer comprising an active cell and a reference cell, and the operation on the wafer or chip state in the bolometer, for end and parametric test, and the row line selection unit comprises: a bolometer selecting a cell to be subjected to the applied voltage, and the output multiplexer unit infrared sensor chip for outputting the voltage-current characteristics according to the application is provided.