首页> 外国专利> PATTERN FORMING METHOD CAPABLE OF OBTAINING SUPERIOR DEVELOPMENT EFFECTS BY UNDERGOING GRADUAL DEVELOPMENT PROCESSES USING DEVELOPMENT LIQUID WITH DIFFERENT CONCENTRATIONS

PATTERN FORMING METHOD CAPABLE OF OBTAINING SUPERIOR DEVELOPMENT EFFECTS BY UNDERGOING GRADUAL DEVELOPMENT PROCESSES USING DEVELOPMENT LIQUID WITH DIFFERENT CONCENTRATIONS

机译:通过使用不同浓度的开发液进行渐进式开发过程来获得优异的开发效果的图案形成方法

摘要

PURPOSE: A pattern forming method is provided to remove residual films when a pattern is formed on the surface of a substrate.;CONSTITUTION: A pattern forming method includes the following steps of: laminating a dry film resist(DFR) on the surface of a substrate(ST10); arranging a mask with a pattern on the DFR and exposing(ST20); developing an exposure pattern formed on the DFR(ST30); and etching the surface of the substrate(ST40). The step of developing the exposure pattern includes first and second development steps. Development liquids with different concentrations are used for the first and second development steps.;COPYRIGHT KIPO 2013;[Reference numerals] (ST10) Laminating step; (ST20) Exposing step; (ST30) Developing step; (ST40) Etching step
机译:目的:提供一种图案形成方法,以在基板表面形成图案时去除残留的薄膜。;构成:图案形成方法包括以下步骤:在基板表面上层压干膜抗蚀剂(DFR)基板(ST10);在DFR上布置具有图案的掩模并曝光(ST20);显影形成在DFR(ST30)上的曝光图案;蚀刻基板的表面(ST40)。显影曝光图案的步骤包括第一和第二显影步骤。第一和第二显影步骤使用了不同浓度的显影液。; COPYRIGHT KIPO 2013; [参考数字](ST10)层压步骤; (ST20)曝光步骤; (ST30)显影步骤; (ST40)蚀刻步骤

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