首页> 外国专利> SICN FILM FORMATION METHOD, CAPABLE OF RELATIVELY MAKING AN ETCHING RATE IN A CLEANING SMALL IN DEPOSITING IN A RELATIVELY LOW TEMPERATURE

SICN FILM FORMATION METHOD, CAPABLE OF RELATIVELY MAKING AN ETCHING RATE IN A CLEANING SMALL IN DEPOSITING IN A RELATIVELY LOW TEMPERATURE

机译:SICN膜形成方法,能够在相对较低的温度下沉积时相对降低清洗率

摘要

PURPOSE: A SiCN film formation method is provided to form a SiCN film on a processed substrate by reiterating a following cycle several times in a processing zone.;CONSTITUTION: A SiCN film formation method comprises the following steps: a supply of a first raw gas about a processing zone(5) is performed; a supply of a second raw gas about the processing zone is performed; a supply of a third raw gas about the processing zone is performed; a supply of the first process gas about the processing zone is blocked; the first, second, third raw gas is supplied to the processing zone without a plasmization outside the processing zone; and through a first, a second, a third, and a fourth process, the processing zone is heated with a first temperature in which a silane gas, a nitrous gas, and a hydrocarbon gas are reacted each other.;COPYRIGHT KIPO 2013
机译:目的:提供一种SiCN膜形成方法,以通过在处理区中重复多次以下循环在处理后的基板上形成SiCN膜。组成:SiCN膜形成方法包括以下步骤:供应第一原料气关于处理区域(5);在处理区域附近进行第二原料气的供给。在处理区域附近进行第三原料气的供给。阻止围绕处理区的第一处理气体的供应;将第一,第二,第三原料气不经等离子体处理地输送到处理区。并通过第一,第二,第三和第四工艺,以第一温度加热加工区,在该温度下,硅烷气体,亚硝酸气体和烃气体彼此反应。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130064766A

    专利类型

  • 公开/公告日2013-06-18

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号KR20130059837

  • 发明设计人 CHOU PAO HWA;HASEBE KAZUHIDE;

    申请日2013-05-27

  • 分类号C23C16/34;C23C16/00;

  • 国家 KR

  • 入库时间 2022-08-21 16:26:54

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