首页> 外国专利> MONOMORS CAPABLE OF HAVING AN EXCELLENT TRANSPARENCY TO RADIATION WITH A WAVELENGTH OF LESS THAN 500 NM AND BEING USEFULLY USED AS THE RAW MATERIAL MONOMERS OF POLYMERS FOR MANUFACTURING THE BASE RESIN OF RADIATION-SENSITIVE RESIST MATERIALS HAVING AN EXCELLENT DEVELOPMENT CHARACTER, POLYMERS, RESIST COMPOSITIONS AND A PATTERNING PROCESS

MONOMORS CAPABLE OF HAVING AN EXCELLENT TRANSPARENCY TO RADIATION WITH A WAVELENGTH OF LESS THAN 500 NM AND BEING USEFULLY USED AS THE RAW MATERIAL MONOMERS OF POLYMERS FOR MANUFACTURING THE BASE RESIN OF RADIATION-SENSITIVE RESIST MATERIALS HAVING AN EXCELLENT DEVELOPMENT CHARACTER, POLYMERS, RESIST COMPOSITIONS AND A PATTERNING PROCESS

机译:能够对波长进行小于500 NM的辐射而具有出色的透明度的辐射,并且可以用作制造聚合物的基本树脂单体,用于辐射敏感的树脂材料,并具有相当的抗反射性拼版过程

摘要

PURPOSE: Monomers are provided to have high dissolution contrast in alkaline development and organic solvent development and provide the base resin of photoresist compositions with a high sensitivity.;CONSTITUTION: Monomers is represented by a chemical formula (1A) or (1B). Here, R^1 indicates hydrogen, a methyl group and a trifluoromethyl group. R^2 indicates a cyclic monovalent hydrocarbon group of C3-15. R^3 and R^4 respectively indicate a straight chained, branched or cyclic monovalent hydrocarbon group of C1-15. R^5 indicates a straight chained, branched or cyclic monovalent hydrocarbon group of C1-15. X^1 and X^2 respectively indicate a single bond or a straight chained or branched bivalent hydrocarbon group of C1-4. K^1 indicates an integer of 1-3. Z^1 indicates. Z^1 indicates a substituent of C5-15 which is formed with carbon atoms combined with the substituent.;COPYRIGHT KIPO 2013;[Reference numerals] (A) Coating photoresist; (B) Exposing photoresist to light; (C) Organic solvent development
机译:目的:提供单体以在碱性显影和有机溶剂显影中具有高溶解对比度,并为光致抗蚀剂组合物的基础树脂提供高灵敏度。组成:单体由化学式(1A)或(1B)表示。在此,R ^ 1表示氢,甲基和三氟甲基。 R ^ 2表示C3-15的环状一价烃基。 R 3和R 4分别表示C 1-15的直链,支链或环状一价烃基。 R 5表示C 1-15的直链,支链或环状一价烃基。 X ^ 1和X ^ 2分别表示C1-4的单键或直链或支链二价烃基。 K ^ 1表示1-3的整数。 Z ^ 1表示。 Z ^ 1表示C5-15的取代基,其由碳原子与取代基结合形成。; COPYRIGHT KIPO 2013; [参考数字](A)涂布光刻胶; (B)使光致抗蚀剂曝光; (C)有机溶剂开发

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