DEVICE AND A METHOD FOR ANALYZING THE CLEANNESS OF AN MG MATERIAL, CAPABLE OF CHANGING PROCESS VARIABLES BY GRASPING THE LEVEL OF CLEANNESS AND UTILIZING THE SAME FOR IMPROVING A PRODUCT QUALITY

摘要

PURPOSE: A device and a method for analyzing the cleanness of an Mg material are provided to calculate the content of an Mg filler according to properties of the MG filler with respect to the Mg material, thereby rapidly measuring the cleanness of the Mg material.;CONSTITUTION: A device for analyzing the cleanness of an Mg material(10) comprises a scanning unit and a signal processing unit. The scanning unit measures the spectrum intensity of each element included in the Mg material by using sparks generated between the Mg material and high-voltage electrode(110). The signal processing unit sets data groups per a predetermined time band in the data of the measured spectrum intensity of the Mg material elements, calculates a representative inclination, correct each data to make the representative inclination zero, removes an offset by compensating spectrum intensity values of each data groups, generates a histogram with respect to frequencies per the spectrum intensity, calculate the sum of areas of the Mg filler based on the histogram, and calculates the content of the Mg filler by substituting the area sum into a prepared calibration curve.;COPYRIGHT KIPO 2013