首页> 外国专利> METHOD FOR APPOINTING ORIENTATION FLAT, APPARATUS FOR DETECTING ORIENTATION FLAT, AND RECORDING MEDIUM HAVING PROGRAM FOR APPOINTING ORIENTATION FLAT RECORDED THEREIN

METHOD FOR APPOINTING ORIENTATION FLAT, APPARATUS FOR DETECTING ORIENTATION FLAT, AND RECORDING MEDIUM HAVING PROGRAM FOR APPOINTING ORIENTATION FLAT RECORDED THEREIN

机译:定位方向的方法,检测方向的设备以及记录其中记录的定位方向的具有媒体的程序

摘要

the present invention is the same as the length of the orientation flat is mixed to a plurality of the same length, even if any one of the orientation flat of the to provide a method that can reliably specify the orientation flat as a reference to specify the orientation flat as a challenge. Specify how the orientation flat of the present invention, by rotating the semiconductor wafer (W) of the three positions the orientation flat 1, 2, 3, respectively, detected, and the orientation flat of the three positions 1, 2 and 3 points in the arc of between 3 1, 2, and 3 of the length determined, respectively, of three circular arc portions 1 and 2, because the designated three of the orientation flat in the right side of the circle 2 of the length of the longest orientation flat as a reference, a plurality of arc of the same length there may also be sure to specify the criteria orientation flat. ;
机译:本发明是将定向平板的长度相同地混合到多个相同的长度,即使提供了一种定向平板的方法,也可以提供一种能够可靠地指定定向平板的基准的方法。方向平坦是一个挑战。通过旋转三个位置的半导体晶片(W)分别检测出方向平面1、2、3和三个位置1、2和3的方向平面来指定本发明的方向平面分别确定三个圆弧部分1和2的长度的3 1、2和3之间的圆弧,因为指定的三个取向平面在最长取向的长度的圆2的右侧以平面为基准,同样长度的多个圆弧也可以确保指定方向为平面。 ;

著录项

  • 公开/公告号KR101300852B1

    专利类型

  • 公开/公告日2013-08-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20100027917

  • 发明设计人 아라이 가오리;

    申请日2010-03-29

  • 分类号H01L21/68;H01L21/02;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:37

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