METHOD FOR INTEGRAL-SCINTILLATION ELEMENT-PHASE SURVEY OF SUBSTANCE WITH ITS FRACTIONAL EVAPORATION INTO PLASMA

摘要

FIELD: measurement equipment.;SUBSTANCE: invention relates to spectral analysis. In the method the distance from the upper edge of the evaporator to its bottom is made as more than 5 mm, and the surveyed substance is placed onto the bottom of the evaporator, so that the surveyed substance is in the centre of the bottom, and when heated, it does not contact with the side walls of the evaporator. On the bottom of the cylindrical evaporator, a small amount of the surveyed substance is placed, which fully evaporates from the evaporator in process of its side walls burning, at the same time in process of survey the substance heating temperature is measured once at a time. Analytic signals that characterise number of atoms evaporating from the substance melt, at different moments of time (frames) are registered using atomic spectral analysis with application of the integral-scintillation frame method of spectra registration. Results of substance and its melt survey are produced using calculation of chemical element contents by "ratio of conventional contents" of a large number of elements without knowledge of mass of the surveyed substance or its virtual weighed microportions.;EFFECT: increased efficiency of analysis.;2 cl, 3 dwg, 2 tbl