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A method for testing of circuit units to be tested by means of qualified voting and test device for carrying out the method
A method for testing of circuit units to be tested by means of qualified voting and test device for carrying out the method
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机译:通过合格投票对待测电路单元进行测试的方法和执行该方法的测试装置
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摘要
Test device for the testing of circuit units to be tested (101a, 101n), with:a) connection units (106a – 106n) for the connection of the circuit units to be tested (101a, 101n) with the test device;b) a test system (100), which(i) test data (112) to be tested in the circuit units (101a, 101n) writes;(ii) of the test circuit units (101a, 101n) as a function of the written data test data (112) measurement data is generated (110a – reads 110n); and(iii) the measurement data read out (110a – 110n) with predetermined direction, to select the data (111) compares and test result data (109) in dependence upon the comparison; andc) an output unit (108) for the output of the test result data (109),characterized in thatthe test device further comprises:d) a determining unit (103) for the determination of those of the measurement data (110a – 110n), which are used for a predeterminable number of the circuit units to be tested (101a, 101n) correspond, for fixing the corresponding measurement data (110a – 110n) by means of a majority decision device than the select the data (111) and for the output of the select the data (111) direction; ande) comparison units (104a – 104n) for comparing the of the test circuit units (101a, 101n) as a function of the written data test data (112) measurement data produced (110a – 110n) with the of the determining unit (103) select the data output device (111), in order to control data (115a – 115n) as a basis of the test result data (109) to obtain,f) wherein the determination unit (103) between the test circuit units (101a, 101n) is coupled and the comparison units.
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