首页> 外国专利> A method and device for dreimdimensional spatially resolved, graphic representation of complete defect information symbolizing means in a massive the crystal body, by means of hard x-radiation

A method and device for dreimdimensional spatially resolved, graphic representation of complete defect information symbolizing means in a massive the crystal body, by means of hard x-radiation

机译:通过硬质x射线在三维晶体中进行三维空间分辨,完整缺陷信息符号化装置的图形表示的方法和装置

摘要

The invention relates to a method and a device for the three-dimensionally spatially resolved, pictorial representation of complete defect information in solid crystal bodies by means of hard X-ray radiation (31), wherein the crystal bodies (5) have a minimum thickness (D) that depends on the atomic number, containing – a microfocus X-ray tube (2), which provides a direct primary X-ray beam (31) having hard X-ray bremsstrahlung (20) in an energy range from approximately 50 keV to 450 keV, - a crystal body retaining device (9) for retaining the crystal body (5) to be examined, - a detector (7) having a detector recording surface (71), which is arranged at a distance (R1) from the beam outlet (21) of the microfocus X-ray tube (2), wherein the crystal body (5) is radiographed to produce an X-ray shadow microscopy recording on the detector (7, 71) in order to register the macroscopic defect structure of the crystal body (5), - wherein, in order to produce linear bremsstrahlung interferences capable of being registered on the detector recording surface (71), an aperture (4) is arranged behind the beam outlet (21) of the microfocus X-ray tube (2) and in front of the retained crystal body (5) in order to reduce lateral scattered radiation and to set a beam divergence, wherein the aperture (4) is provided with a hole diameter in the millimeter range, wherein a distance (R2) between the crystal body (5) and the detector recording surface (71) is set, which distance is approximately twenty times the distance (R1 - R2) of the crystal body (5) from the beam outlet (21) of the microfocus X-ray tube (2) and wherein an acceleration voltage (U) and a current (I) of the microfocus X-ray tube (2) can be set by means of an electronic control unit, which produces a beam intensity after the crystal body (5), wherein the intensity of the maximum of the primary X-ray beam (31) is reduced by the absorption of the crystal body (5) by at least 25% relative to the intensity maximum, whereby a ratio between the remaining beam intensity (3) producing the X-ray shadow microscopy recordings and the interference beam intensity can be set, by means of which ratio a registerable contrast image (52', 52'', 52''') of interference lines (6'') and X-ray shadow microscopy recordings within the imaging cone (6’) can be displayed, characterized in that an arranged crystal body retaining device (9) is rotatably supported between the aperture (4) and the detector (7, 71) in the beam path, the drive of which crystal body retaining device is connected to a control unit (14), which rotates the crystal body retaining device (9) in a controlled manner in an angular range between 0 degrees and 360 degrees in sufficiently small discrete steps about the rotational axis (57) of the crystal body retaining device, wherein the evaluation area for creating a visible spatially resolved three-dimensional model (51', 51'', 51''') of the real crystallographic structure and/or a contrast image (52', 52'', 52''') of the complete defect information comprises the control unit (14), at least one memory, and at least a functional unit (60) for evaluating a data set that is connected to a displaying results display unit (15), wherein the resulting X-ray shadow microscopy recording within the imaging cone (6') and the linear bremsstrahlung interferences (6'') of the radiographed crystal body area are synchronously imaged on the detector (7, 71), read out, and stored as a data set in the memory (66) connected to the control unit (14) for further processing in the functional unit (60) for evaluating a data set.
机译:本发明涉及一种用于通过硬X射线辐射(31)对固态晶体中的完整缺陷信息进行三维空间分辨的图形表示的方法和装置,其中,晶体(5)具有最小的厚度(D)取决于原子数,包含–微焦点X射线管(2),它提供直接的初次X射线束(31),其硬X射线致辐射(20)的能量范围约为50 keV至450 keV,-用于保持要检查的晶体(5)的晶体保持装置(9),-具有距离(R <微聚焦X射线管(2)的光束出口(21)的Sub> 1 ),其中对晶体(5)进行射线照相以在探测器(7)上产生X射线阴影显微镜记录, 71)为了记录晶体(5)的宏观缺陷结构,-为了产生线性致为了能够在检测器记录表面(71)上进行记录,在微焦点X射线管(2)的光束出口(21)的后面,并在保留的晶体(5)的前面布置了一个孔(4)。为了减少横向散射辐射并设置光束发散,其中孔(4)的孔径在毫米范围内,其中晶体(5)之间的距离(R 2 ) )并设置检测器记录表面(71),该距离约为晶体(5)与晶体(5)的距离(R 1 -R 2 )的二十倍。微焦点X射线管(2)的光束出口(21),其中微焦点X射线管(2)的加速电压(U)和电流(I)可以通过电子控制单元进行设置,其在晶体(5)之后产生光束强度,其中通过晶体(5)的吸收使初级X射线束(31)的最大强度降低至少25%。相对于最大强度,可以设置产生X射线阴影显微镜记录的剩余光束强度(3)与干涉光束强度之间的比率,通过该比率可记录对比图像(52',52''可以显示干涉线(6''),52'',52'')和成像锥(6')内的X射线阴影显微镜记录,其特征在于,排列的晶体保持装置(9)可旋转地支撑在孔(4)和光路中的检测器(7、71),其晶体保持装置的驱动器连接到控制单元(14),控制单元以受控方式旋转晶体保持装置(9)。围绕晶体保持装置的旋转轴(57)以足够小的离散步长在0度到360度之间的角度范围,其中评估区域用于创建可见的空间分辨三维模型(51',51'',真正的晶体学51'')完整缺陷信息的结构和/或对比图像(52',52'',52''')包括控制单元(14),至少一个存储器和至少一个功能单元(60),用于评估缺陷连接到显示结果显示单元(15)的数据集,其中在成像锥体(6')内进行的X射线阴影显微镜记录和射线照相晶体体区域的线性致强干涉(6'')同步进行在检测器(7、71)上成像,读出并作为数据集存储在与控制单元(14)相连的存储器(66)中,以便在功能单元(60)中进行进一步处理以评估数据集。

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