首页> 外国专利> Method for testing surface or spatially extended test object e.g. flat layer used in e.g. battery, involves determining ohmic resistance or impendence values to determine expansion of test object along X,Y and Z directions

Method for testing surface or spatially extended test object e.g. flat layer used in e.g. battery, involves determining ohmic resistance or impendence values to determine expansion of test object along X,Y and Z directions

机译:测试表面或空间扩展的测试对象的方法例如用于电池,涉及确定欧姆电阻或阻抗值,以确定测试对象沿X,Y和Z方向的膨胀

摘要

The method involves arranging two pairs of electrodes (E1,E2,E1',E2') at two ends of a selected measurement line of the test object (5) and applying constant current to two pair of electrodes by a constant current source. The voltage between electrodes is determined by a voltage measurement device. The ohmic resistance values or impendence values are determined from measured voltage by an evaluation device so as to determine the expansion of test object along X,Y and Z directions. An independent claim is included for tester for testing surface or spatially extended test objects by Kelvin method.
机译:该方法包括在测试对象(5)的选定测量线的两端布置两对电极(E1,E2,E1',E2'),并通过恒定电流源向两对电极施加恒定电流。电极之间的电压由电压测量装置确定。通过评估装置从测量的电压确定欧姆电阻值或阻抗值,以便确定测试对象沿X,Y和Z方向的膨胀。对于通过Kelvin方法测试表面或空间扩展的测试对象的测试仪,包含一个独立的主张。

著录项

  • 公开/公告号DE102011053964B3

    专利类型

  • 公开/公告日2012-12-06

    原文格式PDF

  • 申请/专利权人 AMRHEIN MESSTECHNIK GMBH;

    申请/专利号DE20111053964

  • 发明设计人 AMRHEIN HERBERT;

    申请日2011-09-27

  • 分类号G01N27/02;G01R27/02;

  • 国家 DE

  • 入库时间 2022-08-21 16:22:30

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