Apparatus and method for reduction of scattered radiation in the case of spectrometers by means of cover

摘要

The present invention relates to a device and a method for measuring a spectrum of a of a light source to be analyzed is emitted radiation (s). In this case, the radiation (s) of an entrance slit (5) along an axis (a) by means of a diffraction grating (3) on a recipient zone (1) and with regard to the spectrum deflected divided. For the effective reduction of scattered radiation, it is proposed to provide a cover (7) for an edge region (3a) of a diffraction grating (3) to prevent scatter radiation absorbing and of the recipient zone (1) to provide wegreflektierend.