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Reflectivity mes before direction, reflectivity mes the method, membrane thickness measuring device and the membrane thickness measuring method

机译:指向前的反射率,反射率,方法,膜厚测量装置和膜厚测量方法

摘要

A reflectivity mes in front of the direction (1) includes a light source (30), which an irradiating light (l1) supplies a measurement object, a spectroscopic detection unit (80), which in the case of more compartment shafts of the length of the intensity of illumination light (l1) and the intensity of reflection light (l2) from the object to be measured is detected, a coefficient - recording unit (92), which is a transform coefficients k (λ) for converting of a detected value of the intensity of each wavelength of the irradiation light (l1) in a value corresponding to a detected value of the intensity of each wavelength of the reflection light (l2) of a reference - measurement object, and a a reflectivity calculation unit (93), which the reflectivity of each wavelength based on the value is calculated, which the intensity of each wavelength of the reflection light (l2) - measurement object from the reference to obtain from the detected value of the intensity of each wavelength of the irradiation light (l1) and the transform coefficients k (λ). This configuration, the reflectivity of each wavelength of the object under test to accurately measure.
机译:方向(1)前面的反射率mes包括光源(30)和分光镜检测单元(80),该光源向辐照光(l1)提供测量对象,分光镜检测单元(80)的长度更长检测来自被测物体的照明光的强度(l1)和反射光的强度(l2),系数记录单元(92),其是用于转换检测到的被检测物体的变换系数k(λ)。照射光(l1)的各波长的强度的值与与基准测定对象的反射光(l2)的各波长的强度的检测值相对应的值,以及反射率计算部(93) ,根据该值计算出每个波长的反射率,从参考值(i2)-测量对象的反射光(l2)的每个波长的强度中,从检测到的i的每个波长的强度中获取值辐射光(l1)和变换系数k(λ)。这种配置可以对被测物体的每个波长的反射率进行精确测量。

著录项

  • 公开/公告号DE112011103113T5

    专利类型

  • 公开/公告日2013-08-08

    原文格式PDF

  • 申请/专利权人 HAMAMATSU PHOTONICS K.K.;

    申请/专利号DE201111103113T

  • 发明设计人 TETSUHISA NAKANO;KENICHI OHTSUKA;

    申请日2011-09-14

  • 分类号G01N21/27;

  • 国家 DE

  • 入库时间 2022-08-21 16:22:04

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