首页> 外国专利> Machine-controlled precise inspection system for precise dimension measurement of workpiece, selects instruction representation that corresponds to respective results selected by user in result window using indicator

Machine-controlled precise inspection system for precise dimension measurement of workpiece, selects instruction representation that corresponds to respective results selected by user in result window using indicator

机译:机器控制的精密检查系统,用于工件的精确尺寸测量,使用指示器在结果窗口中选择与用户选择的相应结果相对应的指令表示

摘要

The system (10) has an object table (32) that is provided for holding workpieces in field of view of imaging unit (34). The instruction representations are defined and displayed in an editing window. The window-spreading autoscroll process is initiated in response to user selection of respective results in a result window. The instruction representations in editing window are adjusted. The instruction representation that corresponds to respective results selected by user in result window is selected using an indicator.
机译:系统(10)具有对象台(32),该对象台被设置用于将工件保持在成像单元(34)的视场中。指令表示已定义并显示在编辑窗口中。响应于用户在结果窗口中选择相应结果,启动窗口扩展自动滚动过程。调整编辑窗口中的指令表示。使用指示器选择与用户在结果窗口中选择的各个结果相对应的指令表示。

著录项

  • 公开/公告号DE102012220759A1

    专利类型

  • 公开/公告日2013-06-27

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORPORATION;

    申请/专利号DE201210220759

  • 申请日2012-11-14

  • 分类号G05B19/42;G05B19/4093;G01B11;G01N21/88;

  • 国家 DE

  • 入库时间 2022-08-21 16:21:39

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