System for detecting laser attack of integrated circuit chip in semiconductor substrate, has resistor and comparator for detecting potential variations of substrate, where resistor has terminal connected to potential detection contacts

摘要

The system has a detection device formed of a resistor (41) and a comparator (43) for detecting potential variations of a semiconductor substrate (1). An integrated circuit chip has P type boxes (2) and N type boxes (4) extending in a P type upper portion of the substrate. An N type buried layer (16) is extended under a portion of the boxes. The resistor has a terminal connected to ground contacts (12) of the P type boxes and another terminal connected to potential detection contacts (31). The comparator connected in parallel with the resistor detects a potential difference at the terminals.