首页> 外国专利> Method for calibrating microwave weapon emitting high power electromagnetic wave on reflector in e.g. high power microwave system, involves utilizing illumination law for calculation of wave emitted by primary elementary antenna

Method for calibrating microwave weapon emitting high power electromagnetic wave on reflector in e.g. high power microwave system, involves utilizing illumination law for calculation of wave emitted by primary elementary antenna

机译:用于校准在反射器中发射高功率电磁波的微波武器的方法,例如大功率微波系统,涉及利用照明定律来计算初级基本天线发射的波

摘要

The method involves emitting an electromagnetic wave for calibration, and reflecting the wave in the form of primary reflected waves by reflectors. The primary reflected waves are received by an antenna, and an illumination law is utilized for calculation of the electromagnetic wave adapted to be emitted by a primary elementary antenna (16) under the control of a processing unit (20), where the illumination law is utilized for calculation of the reflected waves according to a time reversal principle. Independent claims are also included for the following: (1) a method for emitting a high power electromagnetic wave by an emission system (2) an emission system for emitting high power electromagnetic wave.
机译:该方法包括发射用于校准的电磁波,并通过反射器以一次反射波的形式反射该波。初级反射波由天线接收,并且在处理单元(20)的控制下,利用照明定律来计算适合于由初级基本天线(16)发射的电磁波。用于根据时间反转原理计算反射波。还包括以下独立权利要求:(1)一种用于通过发射系统发射高功率电磁波的方法(2)一种用于发射高功率电磁波的发射系统。

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