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SURFACE ROUGHNESS ESTIMATION METHOD, AND SURFACE ROUGHNESS ESTIMATION DEVICE

机译:表面粗糙度估计方法及表面粗糙度估计装置

摘要

PROBLEM TO BE SOLVED: To estimate surface roughness of a measurement object by rapid and simple processing.;SOLUTION: A copper foil having an anchor is used as a measurement object 100, the measurement object 100 is irradiated with X rays, and the state of the surface roughness is estimated on the basis of transmission quantity of the X rays. A measurement region of the measurement object is divided into micro regions a, b, c, ..., a detection value of the X rays having transmitted through the micro regions a, b, c, ... is acquired, frequency distribution of the detection value in each micro region is created, and the obtained frequency distribution is arithmetic-processed to calculate a surface roughness of the copper foil. An average value m and standard deviation σ of a frequency distribution curve are determined, an average thickness (Middle) of the measurement object 100 is measured using the average value m, a maximum thickness (Max) of the measurement object 100 is estimated by m-3σ, a minimum thickness (Mini) of the measurement object 100 is estimated by m+3σ, and a thickness dimension corresponding to ±3σ is estimated as a maximum height Ry of the surface roughness.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:通过快速且简单的处理来估计测量对象的表面粗糙度;解决方案:将具有锚固件的铜箔用作测量对象100,向测量对象100照射X射线,并且将其状态表面粗糙度基于X射线的透射量来估计。将测量对象的测量区域划分为微区域a,b,c,...,获得已经透射过微区域a,b,c,...的X射线的检测值,并且在每个微小区域中创建检测值,并对获得的频率分布进行算术处理以计算铜箔的表面粗糙度。确定频率分布曲线的平均值m和标准偏差σ,使用平均值m测量测量对象100的平均厚度(中),通过m估计测量对象100的最大厚度(Max) -3σ,通过m +3σ估算出测量对象100的最小厚度(Mini),并将与±3σ相对应的厚度尺寸估算为表面粗糙度的最大高度Ry .;版权:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014044108A

    专利类型

  • 公开/公告日2014-03-13

    原文格式PDF

  • 申请/专利权人 TOPCON CORP;

    申请/专利号JP20120186466

  • 申请日2012-08-27

  • 分类号G01B15/08;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:44

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