首页> 外国专利> DEFECTIVE PIXEL DETECTOR, DEFECTIVE PIXEL DETECTION METHOD AND PROGRAM

DEFECTIVE PIXEL DETECTOR, DEFECTIVE PIXEL DETECTION METHOD AND PROGRAM

机译:缺陷像素检测器,缺陷像素检测方法和程序

摘要

PROBLEM TO BE SOLVED: To provide a defective pixel detector, a defective pixel detection method and a program capable of determining a defective pixel existing on the thin line of a captured image or in the vicinity thereof, even in the case of image pick-up elements where color filters of four different colors are assigned at 2×2 pixel period.SOLUTION: A defective pixel detector includes a calculation unit for calculating the gradient of pixel values of a surrounding pixel group consisting of surrounding pixels of a plurality of colors arranged around an object pixel and continuous in a predetermined direction, a specification unit for specifying a direction of smallest gradient calculated in the calculation unit, and a determination unit for determining whether or not the object pixel is a defective pixel, based on the difference between the pixel value of the object pixel and the pixel value of the surrounding pixels of the same color as the object pixel, in the surrounding pixel group in a direction specified by the specification unit.
机译:解决的问题:为了提供一种缺陷像素检测器,一种缺陷像素检测方法和程序,即使在图像拾取的情况下,该缺陷像素检测方法和程序也能够确定存在于捕获图像的细线上或其附近的缺陷像素。解决方案:缺陷像素检测器包括一个计算单元,用于计算由周围排列的多种颜色的周围像素组成的周围像素组的像素值的梯度对象像素并在预定方向上连续;指定单元,用于指定在计算单元中计算出的最小梯度的方向;以及确定单元,用于基于像素之间的差异来确定对象像素是否为缺陷像素。在周围像素gr中,对象像素的值和与该对象像素颜色相同颜色的周围像素的像素值沿规范单位指定的方向。

著录项

  • 公开/公告号JP2014121075A

    专利类型

  • 公开/公告日2014-06-30

    原文格式PDF

  • 申请/专利权人 SAMSUNG TECHWIN CO LTD;

    申请/专利号JP20120277230

  • 发明设计人 HIRANO MARIKO;

    申请日2012-12-19

  • 分类号H04N5/367;H04N5/33;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:44

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