首页> 外国专利> MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE, AND BARRIER MEMBRANE MEMBER

MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE, AND BARRIER MEMBRANE MEMBER

机译:带电粒子束设备,带电粒子束设备和屏障膜成员

摘要

PROBLEM TO BE SOLVED: To provide a charged particle beam device which can perform observation of a sample in a non-vacuum state and stably capture an observation image with high resolution.;SOLUTION: A member 56 for a charged particle beam device used for a charged particle beam device 1c includes a housing 55 which is attached to a housing 3c, and a barrier membrane element 18a which is provided in the housing 55. In the barrier membrane element 18a, a barrier membrane 19 which airtightly separates the inside and the outside of a vacuum chamber 4a in a state where the pressure of the inside of the vacuum chamber 4a partitioned by the housing 3c and the housing 55 is decompressed to the level lower than the pressure of the outside, and allows a charged particle beam to be transmitted therethrough is formed. In the barrier membrane element 18a, a buffer film 33 which prevents contact between a sample 12 and the barrier membrane 19 is formed on a position closer to a sample stage 22 side than the barrier membrane 19.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种带电粒子束装置,其可以在非真空状态下观察样品并稳定地捕获高分辨率的观察图像。解决方案:用于带电粒子束装置的构件56带电粒子束装置1c具有:安装在壳体3c上的壳体55;和设在该壳体55内的阻挡膜元件18a。在该阻挡膜元件18a中,气密地将内外隔离的阻挡膜19。在由壳体3c和壳体55分隔的真空室4a的内部的压力被减压到低于外部压力的水平的状态下,真空室4a的内部被压缩,并且使带电粒子束透射由此形成。在屏障膜元件18a中,在比屏障膜19更靠近样本台22侧的位置上形成防止样品12与屏障膜19接触的缓冲膜33。版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014053073A

    专利类型

  • 公开/公告日2014-03-20

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECHNOLOGIES CORP;

    申请/专利号JP20120194664

  • 发明设计人 OMINAMI YUSUKE;SAKUMA NORIYUKI;

    申请日2012-09-05

  • 分类号H01J37/18;H01J37/16;H01J37/28;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:57

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