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PHASE MEASUREMENT DEVICE, PHASE MEASUREMENT PROGRAM, AND PHASE MEASUREMENT METHOD

机译:相位测量装置,相位测量程序和相位测量方法

摘要

PROBLEM TO BE SOLVED: To improve accuracy in phase measurement using a coherence beam.SOLUTION: A phase measurement method of calculating phases of a first coherence beam transmitting through a measurement target portion and a second coherence beam transmitting through a portion other than the measurement target portion on the basis of a plurality of imaged interference fringe images includes the steps of: selecting a straight line across a prescribed area where a refractive index and a thickness of a measuring sample are deemed to be uniform and a selection point on the straight line so that two-dimensional positions thereof in a plurality of interference fringe images different in an imaged relative phase difference are the same; determining an intensity distribution curve of an interference fringe on the straight line for each of the interference fringe images; determining an initial phase which is a phase difference from the selection point to a feature point on the intensity distribution curve; and calculating a phase of the measurement target portion on the basis of the initial phase.
机译:解决的问题:为了提高相干光束的相位测量精度。解决方案:一种相位测量方法,用于计算通过测量目标部分透射的第一相干光束和通过测量目标以外的部分透射的第二相干光束的相位。基于多个成像的干涉条纹图像的部分包括以下步骤:在规定的区域上选择一条直线,在该规定的区域上将测量样品的折射率和厚度视为均匀,并在该直线上选择一个点在成像的相对相位差不同的多个干涉条纹图像中,其二维位置相同;为每个干涉条纹图像确定直线上的干涉条纹的强度分布曲线;确定初始相位,该初始相位是强度分布曲线上从选择点到特征点的相位差;并且,基于初始相位来计算计测对象部位的相位。

著录项

  • 公开/公告号JP2013231652A

    专利类型

  • 公开/公告日2013-11-14

    原文格式PDF

  • 申请/专利权人 F K KOGAKU KENKYUSHO:KK;

    申请/专利号JP20120103424

  • 发明设计人 ENDO JUNJI;

    申请日2012-04-27

  • 分类号G01N21/45;G02B21;G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-21 16:17:09

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