APPARATUS FOR MEASURING DRYING RATE AND METHOD FOR MEASURING DRYING RATE USING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide an apparatus for measuring a drying rate and a method for measuring a drying rate using the same in order to measure the drying rate of a substrate material in manufacturing an electronic apparatus.;SOLUTION: The apparatus for measuring a drying rate may include a support part having a substrate seated thereon; and a marking part disposed above the substrate while being vertically and horizontally movable, and forming a marking on the substrate while being in contact with the substrate.;COPYRIGHT: (C)2014,JPO&INPIT