首页> 外国专利> APPARATUS FOR MEASURING A DRYING RATE AND METHOD FOR MEASURING THE DRYING RATE USING THE SAME

APPARATUS FOR MEASURING A DRYING RATE AND METHOD FOR MEASURING THE DRYING RATE USING THE SAME

机译:测量干燥速率的装置和使用该方法测量干燥速率的方法

摘要

the electronics of producing a substrate material for the drying is also a measure for the measuring device and drying it also relates to a measuring method using dry . Dried measurement device according to the invention for this purpose the support in which the substrate is mounted ; And is disposed over the substrate and configured to be movable vertically and horizontally , into contact with the substrate , and the marking unit for forming a mark on the substrate, provided with a , and the marking portion , the roller portion in contact with the substrate; and a driving unit for moving up, down, left, and right parts of the roller ; relates to drying apparatus including a measurement ;
机译:生产用于干燥的基材的电子设备也是测量装置的一项措施,它的干燥也涉及使用干燥的测量方法。为此目的,根据本发明的干燥的测量装置是支撑件,衬底被安装在支撑件中。并且设置在基板上,并且构造成能够上下移动以与基板接触,以及用于在基板上形成标记的标记单元,该标记单元设有与基板接触的标记部,辊部。 ;以及用于使辊的上,下,左和右部分运动的驱动单元;涉及包括测量装置的干燥设备;

著录项

  • 公开/公告号KR101397731B1

    专利类型

  • 公开/公告日2014-05-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20120087384

  • 申请日2012-08-09

  • 分类号G01N21/00;H05K13/08;H05K3/00;

  • 国家 KR

  • 入库时间 2022-08-21 15:40:53

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