首页>
外国专利>
Charged particle dose simulation device , charged particle beam irradiation apparatus , simulation method of charged particle dose , and the charged particle beam irradiation method
Charged particle dose simulation device , charged particle beam irradiation apparatus , simulation method of charged particle dose , and the charged particle beam irradiation method
展开▼
机译:带电粒子剂量模拟装置,带电粒子束照射装置,带电粒子剂量的模拟方法以及带电粒子束照射方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To provide a simulation device and simulation method for charged particle beam amount, which allow early determination of a dose distribution of charged particle beam with a reduced load on arithmetic processing while suppressing the deterioration of accuracy.;SOLUTION: The simulation device 3 includes: an input unit 31 which receives input of simulation data including material information of an irradiation object X and irradiation information of proton beam B; and an arithmetic unit 33 which determines a dose distribution of the proton beam B within the irradiation object X based on the simulation data received by the input unit 31 and a dose distribution kernel. The arithmetic unit 33 forms a Surface Map from the proton beam B assumed to reach the body surface, breaks down the Surface Map to break down the proton beam B into a plurality of beamlets Ba, and determines the dose distribution of the proton beam B within the irradiation body X based on the simulation data received by the input unit 31 and the plurality of beamlets Ba.;COPYRIGHT: (C)2012,JPO&INPIT
展开▼