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Production manner of the piezoelectric body thin film wafer, the composition formula which was formed on the piezoelectric body thin film component,

机译:压电体薄膜晶片的制造方式,在压电体薄膜成分上形成的组成式,

摘要

A method for manufacturing a piezoelectric film wafer includes an etching step for carrying out a dry etching on a piezoelectric film formed on a substrate by using a gas containing Ar, and a step of changing a rate of the dry etching by detecting a change in an emission peak intensity of Na in emitted ion plasma the piezoelectric film. The piezoelectric film is made of an alkali niobate-based perovskite structure expressed in a composition formula (K1-xNax)NbO3 (0.4≦x≦0.7).
机译:压电膜晶片的制造方法包括:蚀刻工序,其通过使用含有Ar的气体,对形成在基板上的压电膜进行干蚀刻;以及,通过检测硅的变化来改变干蚀刻的速度的工序。发射离子等离子体压电膜中Na的发射峰强度。压电膜由以组成式(K1-xNax)NbO3(0.4≤x≤0.7)表示的碱金属铌酸盐基钙钛矿结构制成。

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