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The production methodological null first connected territory (18) of micro structure, and its

机译:微观结构的生产方法无效的第一连通域(18)及其

摘要

The form (12) an insulating substrate provided (18, 20) connecting the first and second regions, a manufacturing method thermoelectric microstructure (10), the second to the connection region from the second connection region of the first forming on the substrate a first set of (14) (with a Seebeck coefficient of the first) semiconductor devices or a conductor extending in parallel in one direction, the second to the connection region from the second connection region of the first forming on the substrate a set of second (with a Seebeck coefficient of the second is electrically isolated from the elements of the first set of) semiconductor devices or a conductor extending parallel to the direction of, and die first substrate in the connection area of ​​the two, to provide electrical connection element (24). The elements of the two sets of single, separated in a predetermined direction by the (1, d 2 d) the average distance in a predetermined connection region, average size of the electrical connection element in a predetermined direction (P) is a single is greater than the maximum value of the average distance between the elements of the set, the distance in the predetermined direction between the edge of the connection the two elements (E) is smaller than the minimum value of the average distance between the elements of a single set.
机译:模板(12)是提供绝缘的基板(18、20),其连接第一和第二区域,制造方法热电微结构(10),第二至连接区域从第一的第二连接区域在基板上形成第一一组(14)(具有塞贝克系数的第一半导体器件)或在一个方向上平行延伸的导体,第二至第二连接区域从第一连接区域的第二连接区域形成在基板上第二个的塞贝克系数与第一组半导体器件的元件或平行于其方向延伸的导体电隔离,并在两者的连接区域中隔离第一衬底,以提供电连接元件( 24)。两组单个元素,在预定方向上由(1,d 2 d)隔开,它们在预定连接区域中的平均距离为电连接元件在预定方向(P)上的单个大于大于该集合中的元件之间的平均距离的最大值,在连接元件的边缘之间在预定方向上的距离(E)较小大于单个集合中元素之间的平均距离的最小值。

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