首页> 外国专利> Measuring jig of micrometer

Measuring jig of micrometer

机译:千分尺测量夹具

摘要

PROBLEM TO BE SOLVED: To provide a small-scale measuring tool for accurately and easily measuring the longitudinal size of a long object with a micrometer by oneself.;SOLUTION: The measuring tool for micrometers includes: a frame; an anvil having a measuring surface to be contacted with one end face in the longitudinal direction of a long object and disposed at one end of the frame; and a spindle having a measuring surface to be contacted with the other end face in the longitudinal direction of the long object and disposed at the other end of the frame to move forward or backward with respect to the direction of the anvil according to the operation of a thimble. The measuring tool for micrometers measures the longitudinal size of the long object by sandwiching the long object between the anvil and spindle, is fixed to the peripheral surface of the anvil and includes a holding member for holding one end in the longitudinal direction of the long object with the one end face in the longitudinal direction of the long object being in contact with the measuring surface of the anvil.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种小型测量工具,该工具可用于自己精确,轻松地用千分尺测量长物体的纵向尺寸。解决方案:千分尺的测量工具包括:框架;砧座,其具有在长条物的长度方向上与一个端面接触的测量表面,并且布置在框架的一端。主轴具有测量表面,该测量表面与长形物体的纵向上的另一端面接触,并设置在框架的另一端,以根据砧座的操作相对于砧座的方向向前或向后移动。顶针。千分尺用测量工具通过将长物体夹在砧座和主轴之间来测量长物体的纵向尺寸,固定在砧的外周表面上,并且包括用于保持长物体的纵向上的一端的保持构件。沿长物体纵向的一个端面与砧座的测量表面接触。;版权所有:(C)2011,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号