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Laser interferometer length measuring machine, processing equipment and parts manufacturing method using the same

机译:激光干涉仪测长机,加工设备及使用其的零件制造方法

摘要

PROBLEM TO BE SOLVED: To improve the accuracy of measurement by decreasing a correction error caused by an influence of refractive index distribution when a measurement output of a measurement interferometer is corrected by using a measurement output of a correction interferometer.;SOLUTION: A laser gauge interferometer 100 using the interference of laser light includes: the measurement interferometer 51 which generates the measurement output corresponding to the displacement of a moving member 33; and the correction interferometer 52 which generates the measurement output corresponding to a change in a refractive index of air at a reference interval of a constant distance. An arithmetic processing device 60 computes a measurement target displacement amount in which the influence of the change in refractive index of air is corrected. Correction laser light irradiated from the correction interferometer 52 passes through the measurement interferometer 51 and travels on the same optical path as an optical path of correction laser light emitted from the measurement interferometer 51 to become interference light corresponding to a change in the refractive index of air through which the measurement laser light passes, and then enters the arithmetic processing device 60.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:当通过使用校正干涉仪的测量输出来校正测量干涉仪的测量输出时,通过减小由折射率分布的影响引起的校正误差来提高测量精度。解决方案:激光测量仪利用激光的干涉的干涉仪100包括:测量干涉仪51,其产生与移动部件33的位移相对应的测量输出;以及校正干涉仪52,其以一定距离的基准间隔生成与空气的折射率的变化相对应的测量输出。算术处理装置60计算测量目标位移量,其中校正了空气的折射率变化的影响。从校正干涉仪52照射的校正激光通过测量干涉仪51,并在与从测量干涉仪51发射的校正激光的光路相同的光路上传播,成为与空气的折射率变化相对应的干涉光。测量激光穿过该光束,然后进入算术处理设备60。版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP5541713B2

    专利类型

  • 公开/公告日2014-07-09

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20100173730

  • 发明设计人 杉浦 啓太;

    申请日2010-08-02

  • 分类号G01B9/02;G01B11/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:12:52

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