首页> 外国专利> Schlieren radiography using a linear radiation source and focusing optics

Schlieren radiography using a linear radiation source and focusing optics

机译:使用线性辐射源和聚焦光学器件进行Schlieren射线照相

摘要

A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis. Such shadowgraph is naturally well defined in the opposite axis of narrow beam origin and can reveal an object's refraction, reflection and/or scattering properties along that axis. An embodiment may also include discriminators (stops, phase shifters, analyzer crystals, etc.) in the beam exiting the object. An embodiment may also include mechanisms for scanning whereby a two-dimensional or three-dimensional image of a large object is made possible. An embodiment may also include an image of an object's internal features being derived from an analysis of the radiation and/or radiation waveform exiting the object.
机译:公开了一种用于观察物体的内部特征以使得物体的内部吸收,折射,反射和/或散射特性可视化的系统。一个实施例可以包括一个或多个穿透辐射束,具有要被成像的内部特征的物体,单个或阵列的辐射光学器件以及用于捕获所产生的阴影图图像的检测系统。穿过物体透射的辐射束通常源自线状源,其沿窄轴具有较高的空间纯度,而在垂直的长轴上具有较低的空间纯度。在长轴上,辐射光学器件捕获并聚焦从对象射出的发散光线,以形成对象的高分辨率图像,否则,阴影图在该轴上将具有模糊的光学器件。这种阴影图自然可以在窄光束起源的相对轴上很好地定义,并且可以显示出该对象沿该轴的折射,反射和/或散射特性。实施例还可以在离开物体的光束中包括鉴别器(光阑,移相器,分析器晶体等)。实施例还可以包括用于扫描的机构,由此使得大物体的二维或三维图像成为可能。实施例还可以包括从对离开对象的辐射和/或辐射波形的分析中得出的对象的内部特征的图像。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号