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Feature point matching device, feature point matching method, and feature point matching program

机译:特征点匹配装置,特征点匹配方法和特征点匹配程序

摘要

It is an object to collate feature points with high accuracy even when geometric transformation such as two-dimensional affine transformation or projective transformation is performed on an image. The feature point matching device 5 according to the present invention is based on a position feature generating unit 51 that generates a position feature amount related to a feature point based on the position of the feature point included in the image, and a pixel value of the feature point included in the image. The pixel value feature generating unit 52 that generates a pixel value feature amount related to the feature point, the first position feature amount generated from the first image by the position feature generating unit 51, and the second by the position feature generating unit 51 The degree of coincidence with the second position feature amount generated from the image of the first pixel value, the first pixel value feature amount generated from the first image by the pixel value feature generation unit 52, and the pixel value feature generation unit 52 A feature matching unit 53 is provided for matching the first feature point and the second feature point based on the degree of coincidence with the second pixel value feature amount generated from the second image.
机译:即使在图像上进行了二维仿射变换或投影变换等几何变换的情况下,也要高精度地对特征点进行核对。根据本发明的特征点匹配装置5基于位置特征产生单元51,该位置特征产生单元51基于图像中包括的特征点的位置以及图像的像素值来产生与特征点有关的位置特征量。图片中包含的特征点。像素值特征生成单元52生成与特征点有关的像素值特征量,由位置特征生成单元51从第一图像生成的第一位置特征量,以及由位置特征生成单元51从第二图像生成的第一位置特征量。与由第一像素值的图像生成的第二位置特征量,由像素值特征生成单元52和第一像素值特征生成单元52从第一图像生成的第一像素值特征量的重合性提供图53所示的图像处理单元,以基于与从第二图像生成的第二像素值特征量的一致度来匹配第一特征点和第二特征点。

著录项

  • 公开/公告号JPWO2012114401A1

    专利类型

  • 公开/公告日2014-07-07

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP20130500712

  • 发明设计人 秋山 達勇;

    申请日2011-11-01

  • 分类号G06T7;

  • 国家 JP

  • 入库时间 2022-08-21 16:11:41

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