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On the aforementioned foundation and multiple positions and the aforementioned foundation which

机译:在上述基础和多个职位以及上述基础上,

摘要

PROBLEM TO BE SOLVED: To provide a drift measuring method detecting a beam drift in a time shorter than in the prior art, a charged particle beam drawing method, and a charged particle beam drawing apparatus.;SOLUTION: A detector 32 detects, in the form of a current value, reflected electrons generated when an electron beam 54 is irradiated onto a reference mark made of a material different in reflectivity from an underlying material, A signal from the detector 32 is amplified by a detector 33 and converted to a digital signal by an A/D converter 34. The digital signal is averaged by a control computer 19, and then used in a drawing data corrector 31 for drift correction.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:为了提供一种在比现有技术短的时间内检测光束漂移的漂移测量方法,带电粒子束绘制方法和带电粒子束绘制设备。解决方案:检测器32在探测器中进行探测。电流值的形式,当电子束54照射到由反射率与底层材料不同的材料制成的参考标记上时产生的反射电子,来自检测器32的信号被检测器33放大并转换为数字信号该数字信号由控制计算机19平均,然后在图形数据校正器31中用于漂移校正。;版权:(C)2011,JPO&INPIT

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