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Inspection data management system and inspection data management method

机译:检验数据管理系统及检验数据管理方法

摘要

PROBLEM TO BE SOLVED: To provide a system and method for management of inspection data for performing effective inspections while suppressing the man-hour of measurement in a manufacturing process with respect to a product in which the quality is affected by the combination of a plurality of manufacturing processes.;SOLUTION: The system for management of the inspection data manages the inspection data of a device manufactured on the same base material through a plurality of manufacturing processes and inspection processes. The system includes: an inspection information memory device for storing a standard model for showing the tendency of the measurement data of the device on the base material that is predetermined for each inspection process and a position to be inspected corresponding to the inspection data on the base material capable of distinguishing the standard model; and a standard model distinguishing section for distinguishing the standard model for each base material on the basis of the measured inspection data at the position to be inspected.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于管理检查数据的系统和方法,以执行有效的检查,同时抑制制造过程中相对于质量受到多种组合影响的产品的测量工时解决方案:用于检查数据管理的系统通过多个制造过程和检查过程来管理在同一基材上制造的设备的检查数据。该系统包括:检查信息存储设备,用于存储标准模型,该标准模型用于显示针对每个检查过程预定的在基材上的设备的测量数据的趋势以及对应于基座上的检查数据的待检查位置。能够区分标准模型的材料;一个标准模型区分部分,用于根据在检验位置上的实测检验数据来区分每种基础材料的标准模型。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5384091B2

    专利类型

  • 公开/公告日2014-01-08

    原文格式PDF

  • 申请/专利权人 アズビル株式会社;

    申请/专利号JP20080315285

  • 发明设计人 鹿島 亨;黒澤 敬;

    申请日2008-12-11

  • 分类号H01L21/02;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 16:10:41

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