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X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLINE MATERIAL SAMPLE, AND AN X-RAY DIFFRACTION APPARATUS
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLINE MATERIAL SAMPLE, AND AN X-RAY DIFFRACTION APPARATUS
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机译:晶体材料样品中晶格结构的X射线衍射方法及X射线衍射仪
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摘要
An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.
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