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SYSTEMS AND METHODS FOR ANALYZING A SAMPLE USING A MASS SPECTROMETRY PROBE CONFIGURED TO CONTACT THE SAMPLE
SYSTEMS AND METHODS FOR ANALYZING A SAMPLE USING A MASS SPECTROMETRY PROBE CONFIGURED TO CONTACT THE SAMPLE
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机译:用于分析质谱的系统和方法,该质谱和质谱被配置为与样品接触
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摘要
The invention generally relates to systems and methods for analyzing a sample using a mass spectrometry probe having a tip that is configured to contact a sample and retain a portion of the sample once the probe has been removed from the sample.
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