首页> 外国专利> ELECTROMAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTROMAGNETIC INTERFERENCE MEASURING METHOD

ELECTROMAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTROMAGNETIC INTERFERENCE MEASURING METHOD

机译:电磁干扰测量装置及电磁干扰测量方法

摘要

Provided is an electromagnetic interference (EMI) measuring device. The EMI measuring device according to the present invention includes an electromagnetic wave eliminating unit eliminating remaining electromagnetic waves from a DUT in response to an eliminating control signal of the control unit. The control unit may calculate EMI of the DUT on the basis of a measured result measured before the elimination of remaining electromagnetic waves. The EMI measuring device according to the present invention may compensate for an error due to remaining electromagnetic waves and measure EMI at high accuracy.
机译:提供了一种电磁干扰(EMI)测量设备。根据本发明的EMI测量装置包括电磁波消除单元,其响应于控制单元的消除控制信号而消除了来自DUT的剩余电磁波。控制单元可以基于在消除剩余电磁波之前测量的测量结果来计算DUT的EMI。根据本发明的EMI测量装置可以补偿由于残留的电磁波引起的误差并且可以高精度地测量EMI。

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