首页> 外国专利> USING IN SITU CAPACITANCE MEASUREMENTS TO MONITOR THE STABILITY OF INTERFACE MATERIALS IN COMPLEX PCB ASSEMBLIES AND OTHER STRUCTURES

USING IN SITU CAPACITANCE MEASUREMENTS TO MONITOR THE STABILITY OF INTERFACE MATERIALS IN COMPLEX PCB ASSEMBLIES AND OTHER STRUCTURES

机译:使用原位电容测量来监视复杂PCB组件和其他结构中界面材料的稳定性

摘要

An electric potential is applied to first and second electrodes on opposite sides of a gap between an electronic component and a heat spreader. At least one of a thermal interface material in the gap, the electronic component and the heat spreader is subjected to a changing physical condition. The electrical capacitance between the electrodes is monitored during the changing physical condition. Such a method can be practiced using an array of components sharing a common heat spreader. An assembly for testing thermal interfaces includes a printed circuit board, a plurality of electronic components mounted to and operatively associated with the printed circuit board, a heat spreader positioned for absorbing heat generated by the electronic components, a first electrode associated with the heat spreader, a plurality of second electrodes associated, respectively, with the electronic component, and a device for monitoring electrical capacitances between the first and second electrodes. The technique may be employed for monitoring physical changes in electronic devices and other structures having interfaces between components.
机译:电势被施加到电子部件和散热器之间的间隙的相对侧上的第一电极和第二电极。间隙中的热界面材料,电子部件和散热器中的至少一种经受变化的物理条件。在不断变化的物理条件下监控电极之间的电容。可以使用共享公共散热器的一系列组件来实践这种方法。用于测试热接口的组件包括:印刷电路板,安装到印刷电路板并与其可操作地关联的多个电子组件,定位为吸收电子组件产生的热量的散热器,与散热器关联的第一电极,分别与电子部件相关联的多个第二电极,以及用于监视第一电极和第二电极之间的电容的装置。该技术可以用于监视电子设备和在组件之间具有接口的其他结构中的物理变化。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号