首页> 外国专利> OPTICAL DISC INSPECTION METHOD IN OPTICAL DISC LIBRARY APPARATUS AND OPTICAL DISC LIBRARY APPARATUS

OPTICAL DISC INSPECTION METHOD IN OPTICAL DISC LIBRARY APPARATUS AND OPTICAL DISC LIBRARY APPARATUS

机译:光盘库设备中的光盘检查方法及光盘库设备

摘要

An optical disc library apparatus, on which and plural optical discs and plural optical drives are mounted, has the ability to reduce the degradation of recording/reproduction capability owing to the variation of temperature. In the optical disc library apparatus, causes for the quality degradation of the optical discs are analyzed; temperature inside the optical disc library apparatus is measured in order to make recoveries in accordance with the causes; an inspection cycle for inspecting the optical discs is determined on the basis of the measured temperature; and the inspection of recording qualities of optical discs on which data have already been recorded and that are stored in the optical disc library apparatus is performed by the optical drives on the basis of the measured temperature.
机译:在其上安装有多个光盘和多个光驱的光盘库设备具有减少由于温度变化而引起的记录/再现能力的降低的能力。在光盘库设备中,分析了光盘质量下降的原因;测量光盘库设备内部的温度以根据原因进行恢复;根据测得的温度确定检查光盘的检查周期;并且,根据测量的温度,由光驱动器进行已经记录了数据并存储在光盘库装置中的光盘的记录质量的检查。

著录项

  • 公开/公告号US2014293764A1

    专利类型

  • 公开/公告日2014-10-02

    原文格式PDF

  • 申请/专利权人 HITACHI-LG DATA STORAGE INC.;

    申请/专利号US201414189082

  • 发明设计人 TAKAKIYO YASUKAWA;

    申请日2014-02-25

  • 分类号G11B7/0045;

  • 国家 US

  • 入库时间 2022-08-21 16:08:00

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