首页> 外国专利> Phase-locked loop with loop gain calibration, gain measurement method, gain calibration method and jitter measurement method for phase-locked loop

Phase-locked loop with loop gain calibration, gain measurement method, gain calibration method and jitter measurement method for phase-locked loop

机译:具有环路增益校准的锁相环,增益测量方法,增益校准方法和用于锁相环的抖动测量方法

摘要

The invention provides a phase-locked loop with loop gain calibration and methods for measuring an oscillator gain, gain calibration and jitter measurement for a phase-locked loop. The method for measuring an oscillator gain of a phase-locked loop includes the steps of providing a varying code at an input end of the oscillator; outputting excess reference phase information by a reference phase integral path and outputting excess feedback phase information based on the varying code by a feedback phase integral path; and obtaining an estimated gain information of the oscillator based on the excess reference phase information and the excess feedback phase information.
机译:本发明提供了具有环路增益校准的锁相环以及用于测量锁相环的振荡器增益,增益校准和抖动测量的方法。用于测量锁相环的振荡器增益的方法包括以下步骤:在振荡器的输入端提供变化的代码。通过参考相位积分路径输出多余的参考相位信息,并通过反馈相位积分路径基于变化码输出多余的反馈相位信息;基于所述多余参考相位信息和所述多余反馈相位信息,获取所述振荡器的估计增益信息。

著录项

  • 公开/公告号US8860478B2

    专利类型

  • 公开/公告日2014-10-14

    原文格式PDF

  • 申请/专利权人 NATIONAL CHIAO TUNG UNIVERSITY;

    申请/专利号US201313840134

  • 发明设计人 SHU-CHIN CHUANG;WEI-ZEN CHEN;

    申请日2013-03-15

  • 分类号H03L7/08;G01R25/00;

  • 国家 US

  • 入库时间 2022-08-21 16:06:12

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