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Testing circuit of dual gate cell panel and color display method for dual gate cell panel

机译:双栅单元板的测试电路及双栅单元板的彩色显示方法

摘要

A testing circuit of a dual gate cell panel and a color display method of the dual gate cell panel. There are many data lines and scan lines in the dual gate cell panel, and the data lines are divided into three groups, and the scan lines are divided into two groups. The data lines or scan lines of each group are connected respectively to metal wires with a test pad each. When an appropriate signal is inputted to each test pad, the dual gate cell panel shows red, green and blue colors individually, so that defects of the dual gate cell panel can be detected accurately to avoid any unnecessary waste on the defective dual gate cell panel incurred in the subsequent manufacturing processes.
机译:双栅单元面板的测试电路及双栅单元面板的彩色显示方法。双栅单元面板中有许多数据线和扫描线,并且数据线分为三组,而扫描线分为两组。每组的数据线或扫描线分别通过测试垫连接至金属线。当将适当的信号输入到每个测试焊盘时,双栅单元面板分别显示红色,绿色和蓝色,从而可以准确检测双栅单元面板的缺陷,避免在有缺陷的双栅单元面板上产生不必要的浪费后续制造过程中产生的费用。

著录项

  • 公开/公告号US8754914B2

    专利类型

  • 公开/公告日2014-06-17

    原文格式PDF

  • 申请/专利权人 TAI-FU LU;

    申请/专利号US201113314546

  • 发明设计人 TAI-FU LU;

    申请日2011-12-08

  • 分类号G09G5/02;

  • 国家 US

  • 入库时间 2022-08-21 16:04:23

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