Testing device and testing method for non destructive detection of a defect in a test piece by means of an eddy current

摘要

A test set-up (10) for non-destructive detection of a flaw in a device being tested by means of an eddy current has an excitation coil (14), to which an excitation signal (SE) can be sent to act on the device being tested (16) with an electromagnetic alternating field, a receiving coil (17) to generate a coil signal (SP), which is a function of the flaw in the device being tested (16), an analog-digital converter (21), which is coupled to the receiving coil (17) on the input side, a filter arrangement (22), which is coupled to the analog-digital converter (21) on the input side and is designed for band-pass filtering and scan rate reduction, and a demodulator (27), which is coupled to an output of the filter arrangement (22) on the input side.