首页> 外国专利> Method and apparatus for measuring refractive index based on a ratio between a number of second fringes divided by a difference of the number of second fringes minus a number of first fringes

Method and apparatus for measuring refractive index based on a ratio between a number of second fringes divided by a difference of the number of second fringes minus a number of first fringes

机译:基于第二条纹的数量除以第二条纹的数量减去第一条纹的数量之差得到的比率来测量折射率的方法和装置

摘要

A method and apparatus for measuring refractive index of an object are disclosed. The method includes, acquiring a number of first fringes of a first interference pattern formed by interference of a first beam of light transmitted through the object with a second beam of light not transmitted through the object; acquiring a number of second fringes of a second interference pattern formed by interference of a third beam of light reflected from a first surface of the object with a fourth beam of light transmitted through the object and reflected from a second surface of the object; and calculating the refractive index of the object based on the number of first fringes and the number of second fringes. The method may further include calculating the Abbe number of the object based on the refractive indices of the object measured at different wavelengths.
机译:公开了一种用于测量物体的折射率的方法和设备。该方法包括:获取第一干涉图案的多个第一条纹,该第一干涉图案的多个条纹是由透射穿过该物体的第一光束与不透射穿过该物体的第二光束的干涉形成的;获取第二干涉图样的第二条纹,该第二干涉图样的第二条纹是由从物体的第一表面反射的第三光束与穿过物体并从物体的第二表面反射的第四光束干涉形成的;根据第一条纹的数量和第二条纹的数量,计算出物体的折射率。该方法可以进一步包括基于在不同波长下测量的物体的折射率来计算物体的阿贝数。

著录项

  • 公开/公告号US8687204B2

    专利类型

  • 公开/公告日2014-04-01

    原文格式PDF

  • 申请/专利权人 CHUNG-CHIEH YU;

    申请/专利号US201113071383

  • 发明设计人 CHUNG-CHIEH YU;

    申请日2011-03-24

  • 分类号G01N21/41;

  • 国家 US

  • 入库时间 2022-08-21 16:00:11

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