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Pseudo buried layer and manufacturing method of the same, deep hole contact and bipolar transistor

机译:伪埋层及其制造方法,深孔接触和双极晶体管

摘要

The present invention discloses a pseudo buried layer, a deep hole contact and a bipolar transistor, and also discloses a manufacturing method of a pseudo buried layer, including: etching a silicon substrate to form an active region and shallow trenches; sequentially implanting phosphorous ion and arsenic ion into the bottom of the shallow trenches to form phosphorus impurity regions and arsenic impurity regions; conducting thermal annealing to the phosphorus impurity regions and arsenic impurity regions. The implantation of the pseudo buried layer, adopting phosphorous with rapid thermal diffusion and arsenic with slow thermal diffusion, can improve the impurity concentration on the surface of the pseudo buried layers, reduce the sheet resistance of the pseudo buried layer, form a good ohmic contact between the pseudo buried layer and a deep hole and reduce the contact resistance, and improve the frequency characteristic and current output of triode devices.
机译:本发明公开了一种伪掩埋层,深孔接触和双极晶体管,还公开了一种伪掩埋层的制造方法,包括:蚀刻硅衬底以形成有源区和浅沟槽;将磷离子和砷离子依次注入到浅沟槽的底部,以形成磷杂质区和砷杂质区。对磷杂质区和砷杂质区进行热退火。伪埋层的注入采用快速扩散的磷和缓慢扩散的砷,可以提高伪埋层表面的杂质浓度,降低伪埋层的薄层电阻,形成良好的欧姆接触在伪掩埋层和深孔之间,减小了接触电阻,并改善了三极管器件的频率特性和电流输出。

著录项

  • 公开/公告号US8592870B2

    专利类型

  • 公开/公告日2013-11-26

    原文格式PDF

  • 申请/专利权人 DONGHUA LIU;WENSHENG QIAN;

    申请/专利号US201113227387

  • 发明设计人 WENSHENG QIAN;DONGHUA LIU;

    申请日2011-09-07

  • 分类号H01L31/0328;H01L31/0336;H01L31/072;H01L31/109;H01L29/167;H01L29/207;H01L29/227;H01L31/0288;

  • 国家 US

  • 入库时间 2022-08-21 15:59:53

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