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Method and apparatus for single event upset (SEU) detection and correction

机译:用于单事件失败(SEU)检测和校正的方法和设备

摘要

A method, non-transitory computer readable medium, and apparatus for performing single event upset detection and correction are disclosed. For example, the method comprises: setting, by a processor, at least one starting address for each of a plurality of rows of a design for an integrated circuit, setting, by the processor, at least one ending address for each of the plurality of rows of the design, and performing, by the processor, the single event upset detection and correction scan in parallel, from the at least one starting address for each of the plurality of rows to the at least one ending address for each of the plurality of rows.
机译:公开了一种用于执行单事件失常检测和校正的方法,非暂时性计算机可读介质和装置。例如,该方法包括:由处理器为集成电路设计的多个行中的每一行设置至少一个起始地址,由处理器为多个集成电路中的每一个设置至少一个结束地址。设计行,并由处理器并行执行从多个行中每个行的至少一个起始地址到多个行中每个行的至少一个结束地址并行的单事件翻转检测和校正扫描行。

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