首页> 外国专利> Quantitative trait loci associated with soybean cyst nematode resistance and methods of their use

Quantitative trait loci associated with soybean cyst nematode resistance and methods of their use

机译:与大豆孢囊线虫抗性相关的数量性状基因座及其使用方法

摘要

Several QTLs that are genetically linked to resistance to soybean cyst nematode (SCN) are disclosed. These QTLs have been mapped to genomic regions on Chrs. 4, 8, 10, 11, 18, and 20 of soybean, G. max. Candidate genes underlying these QTLs as defined by the flanking markers, as well as genetic markers associated with these QTLs are also disclosed. These markers can be utilized for introgressing SCN resistance into non-resistant soybean germplasm. The unique resistance genes can be introduced into a non-resistant plant by marker-assisted selection (MAS) or by transgenic methods.
机译:公开了几个与大豆囊肿线虫(SCN)抗性遗传相关的QTL。这些QTL已映射到Chrs上的基因组区域。大豆G的4、8、10、11、18和20。最大。还公开了由侧翼标记定义的这些QTL基础的候选基因,以及与这些QTL相关的遗传标记。这些标记可以用于将SCN抗性渗入非抗性大豆种质中。可以通过标记辅助选择(MAS)或通过转基因方法将独特的抗性基因导入非抗性植物。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号