OPTOELECTRONIC DEVICE AND PROCESS FOR MEASUREMENT AND QUALITATIVE ANALYSIS OF INTERNAL SURFACES OF ARCHAEOLOGICAL AND ART OBJECTS BY LIF TECHNIQUE

摘要

The invention relates to an optoelectronic device and a process for the measurement and the qualitative analysis of the internal surface of objects. According to the invention, the device comprises a laser irradiation source () with solid active medium, a laser diode telemeter (), a detector consisting of a spectrometer (), sensitive in the visible range, which can be released from outside using an electronic system, three prisms (), each of them having a reflective surface for a certain wave length, to reflect and direct the beams emitted by the laser diode of the telemeter (), by the laser source () and the beam emitted by the object to be analysed as a response to the irradiation coming from the laser source (), an optical filter () which eliminates the diffraction maximal values of the second and third range and blocks the excitation energy, an optical collector () representing a convergent focusing system intended to focus the beam inside an optical fiber () connected to the spectrometer (), a mirror () to be introduced into the object, the mirror being provided with a fastening and positioning assembly driven by a servomotor, by means of an articulation (), a rotation platform () which supports the weight of the object to be analysed and the rotation thereof for scanning purposes, and some controllers () which are electronic components ensuring the control of the release of the laser spot, of the laser diode telemeter, of the rotation motors and the rotation platform, as well as the communication between them and a computer (). The process, as claimed by the invention, consists in point-by-point irradiating the surface to be analysed with a low-energy laser beam, collecting the fluorescence induced thereby at the material surface and the spectroscopic analysis of the captured signals for characterizing the surface composition.