Device for sample characterization by diffraction or x-ray scatter

摘要

Device for sample characterization by diffraction or x-ray scatter. # Allows the characterization of samples under controlled environment conditions, such as humidity, pressure, temperature controlled or reducing atmosphere, inert, oxidizing, etc. by diffraction / scattering X-rays without using sample holder (6) specially adapted. Comprises a source (2) X-ray, a collimator-focuser (3) and a detector (4). further comprising two compartments (7) under vacuum defining a cavity (5) adapted to receive the sample, limited said cavity (5) by a closure means (11, 12, 14) airtight and watertight; and control means (8) environment to control the environment of the sample within the cavity (5).