QUARTZ-TEMPERATURE-MEASUREMENT PROBE AND QUARTZ-TEMPERATURE-MEASUREMENT DEVICE

摘要

The present invention makes it possible to achieve highly accurate temperature measurements in the range of 1/1,000,000°C (one-millionth of 1°C) to 9/1,000,000°C (nine-millionths of 1°C), when measuring temperature on the basis of the oscillating frequency of a quartz-crystal oscillator. A quartz-crystal oscillator (31; Y-cut) exhibits temperature properties in which the oscillating frequency significantly changes in relation to temperature, while a quartz-crystal oscillator (32; AT-cut) exhibits temperature properties in which the oscillating frequency is stable in relation to temperature. The quartz-crystal oscillators (31, 32) are cut from the same type of starting material, and are configured in a manner such that the shape, material and size thereof are substantially identical. Furthermore, the frequencies of the signals thereof generated in a frequency difference circuit (35) combine to be 10kHz or less in the measurement range of 21-30°. The frequencies of the signals generated in the frequency-difference generation circuit (35) are outputted to the main unit of the measurement device. A frequency-counting circuit (15) measures the frequencies of the signals in a manner such that the number of significant digits is at least eight or more using the reciprocal method.