首页> 外国专利> METHOD FOR ASCERTAINING THE PERMEABILITY OF A DIELECTRIC LAYER OF AN OPTOELECTRONIC COMPONENT; APPARATUS FOR ASCERTAINING THE PERMEABILITY OF A DIELECTRIC LAYER OF AN OPTOELECTRONIC COMPONENT; OPTOELECTRONIC COMPONENT AND METHOD FOR PRODUCING AN OPTOELECTRONIC COMPONENT

METHOD FOR ASCERTAINING THE PERMEABILITY OF A DIELECTRIC LAYER OF AN OPTOELECTRONIC COMPONENT; APPARATUS FOR ASCERTAINING THE PERMEABILITY OF A DIELECTRIC LAYER OF AN OPTOELECTRONIC COMPONENT; OPTOELECTRONIC COMPONENT AND METHOD FOR PRODUCING AN OPTOELECTRONIC COMPONENT

机译:确定光电元件介电层的渗透性的方法;用于确定光电组件的电介质层的渗透性的装置;光电组件和用于生产光电组件的方法

摘要

Various embodiments provide a method (300) for ascertaining the permeability of a dielectric layer (108) of an optoelectronic component, said method (300) involving: measurement of an electric current level through a dielectric layer (108); and ascertainment of the permeability of the dielectric layer (108) from the measured current level, wherein the measured electric current level is a function of the permeability of the dielectric layer (108) for at least water and/or oxygen.
机译:各种实施例提供了一种用于确定光电子部件的介电层(108)的磁导率的方法(300),所述方法(300)包括:测量通过介电层(108)的电流水平;根据所测量的电流水平确定介电层(108)的磁导率,其中所测量的电流水平是至少对于水和/或氧气的介电层(108)的磁导率的函数。

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