METHOD FOR ASCERTAINING THE PERMEABILITY OF A DIELECTRIC LAYER OF AN OPTOELECTRONIC COMPONENT; APPARATUS FOR ASCERTAINING THE PERMEABILITY OF A DIELECTRIC LAYER OF AN OPTOELECTRONIC COMPONENT; OPTOELECTRONIC COMPONENT AND METHOD FOR PRODUCING AN OPTOELECTRONIC COMPONENT

摘要

Various embodiments provide a method (300) for ascertaining the permeability of a dielectric layer (108) of an optoelectronic component, said method (300) involving: measurement of an electric current level through a dielectric layer (108); and ascertainment of the permeability of the dielectric layer (108) from the measured current level, wherein the measured electric current level is a function of the permeability of the dielectric layer (108) for at least water and/or oxygen.