首页> 外国专利> METHOD FOR ETCHING SEMICONDUCTOR SUBSTRATE, ETCHING LIQUID, METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT, AND ETCHING LIQUID KIT

METHOD FOR ETCHING SEMICONDUCTOR SUBSTRATE, ETCHING LIQUID, METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT, AND ETCHING LIQUID KIT

机译:蚀刻半导体基质的方法,蚀刻液体,制造半导体元件的方法以及蚀刻液体试剂盒

摘要

In this etching method wherein a substrate having a first layer that contains titanium nitride (TiN) and a second layer that contains a transition metal is processed using a single wafer-type apparatus, the first layer is preferentially removed by bringing an etching liquid, which has a pH of 1 or more and contains an oxidant and a specific fluorine compound that is selected from among metal salts and ammonium salts of hydrofluoric acid, into contact with the substrate.
机译:在该蚀刻方法中,使用单晶片型设备加工具有包含氮化钛(TiN)的第一层和包含过渡金属的第二层的基板,优选通过引入蚀刻液来去除第一层,具有等于​​或大于1的pH,并且包含氧化剂和特定的氟化合物,该氟化合物选自氢氟酸的金属盐和铵盐,与基材接触。

著录项

  • 公开/公告号WO2014115805A1

    专利类型

  • 公开/公告日2014-07-31

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORPORATION;

    申请/专利号WO2014JP51382

  • 申请日2014-01-23

  • 分类号H01L21/306;H01L21/308;H01L21/3205;H01L21/768;

  • 国家 WO

  • 入库时间 2022-08-21 15:48:18

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