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AN INTEGRATED CIRCUIT FOR TESTING USING A HIGH-SPEED INPUT/OUTPUT INTERFACE
AN INTEGRATED CIRCUIT FOR TESTING USING A HIGH-SPEED INPUT/OUTPUT INTERFACE
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机译:用于使用高速输入/输出接口进行测试的集成电路
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摘要
An integrated circuit configured for testing is described. The integrated circuit includes a high-speed input/output interface. The integrated circuit also includes a test controller coupled to the high-speed input/output interface. The integrated circuit further includes test circuitry coupled to the test controller. The test controller controls the test circuitry based on controller protocol test information from the high-speed input/output interface.
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